Tatsuya Inaba, a researcher at Auto-ID Lab. Japan, received the Best Paper Award at IEEE International Conference on RFID (IEEE RFID) 2008, held in Las Vegas, NV, USA. IEEE RFID is an international conference organized by IEEE for researches on wireless technologies, information technologies, and applications related to RFID systems.

Many research efforts are being made on RFID in the area of SCM to increase visibility of items in the supply chain, and to improve the efficiency of the whole process in turn. While RFID system is being deployed, however, traceability information is available only from sparsely implemented RFID systems in open supply chains as deployment of the system requires certain period of time in such environments. This reduces the advantage of RFID systems, and hinders the deployment as result. Mr. Inaba's research proposes a possible solution model for this issue which is common while RFID system is being deployed. His paper was awarded for the proposal to solve an issue which the industry is actually facing.

Awarded paper: Value of Sparse RFID Traceability Information in Asset Tracking During Migration Period

Related information: IEEE and ODIN technologies Award Best RFID Paper (release from the award sponsor)